Event Venue and Description: 3M Buckley Innovation Centre, Firth Street, Huddersfield

The new ZEISS Imaging Suite, shortly to open at the 3M BIC, offers businesses an opportunity to investigate, characterise and accurately measure prototypes and products and to look at items that have been damaged in use using laser to understand how and design preventative measures. The ZEISS Imaging Suite will house a range of optical, laser and electron microscopes. These techniques, also enhanced by access to X-Ray technology for internal examination, offer a forensic insight into the surface characteristics of items thus providing valuable information on manufacturing techniques, wear and tear patterns in use or in the case of failure and as part of quality assurance procedures. Microscopic examination is applicable to materials, manufactured products and biological systems. The event will provide an overview of each available technique and its application through real-world examples.

5.00pm – 5.30pm Networking and Refreshments

5.30pm – 5.40pm Dr Michael Wilson, 3M BIC Director of Technology – A Brief Introduction

5.40pm – 6.00pm Paul Ashton, Specialist ZIESS Microscopy – An overview of imaging based on the capabilities available at 3M BIC and how this could benefit your business

6.00pm – 6.20pm Dr Jane Harmer, Senior Research Fellow, School of Applied Sciences, University of Huddersfield – Biological applications of confocal in the context of business relevance

6.20pm – 6.40pm James Halstead, Delivery Manager, NPL – ZEISS Smartproof Integrated Confocal Microscope case study

6.40pm Q&A and Close

Free parking on site will be available.

For further information and details on how to register, please follow the link below.